Title :
A novel feature learning for image classification using wrapper approach in GA
Author :
Pandey, Neha ; Singh, B.K. ; Bist, Ankur Singh
Author_Institution :
Comput. Eng. Dept., G.B.P.U.A.T., Pantnagar, India
Abstract :
In many pattern recognition applications, limiting the number of features is a very important requirement due to high dimensional cost as well as the risk of “overfitting” imposed by the high-dimensional feature vectors. Feature subset selection addresses the dimensionality reduction problem by determining a subset of available features which is most essential for classification. A novel feature learning for image classification is proposed here using wrapper approach in Genetic Algorithm. The proposed method applies GA for feature subset selection and neural network for classification. The method operates by trying to choose the subset of features which lead to the largest margin of class separation between two classes. Experiments are conducted on four benchmark datasets of iris, seed, glass and wine and then used on one domain dataset of rice. Comparison of the proposed approach is made with other approaches like Multi-SVM and GA-LDA to demonstrate its effectiveness and efficiency. Analysis of the experimental results shows that the proposed method outperforms the other two approaches in classification accuracy.
Keywords :
feature selection; genetic algorithms; image classification; learning (artificial intelligence); neural nets; vectors; GA-LDA; dimensionality reduction problem; feature learning; feature subset selection; genetic algorithm; high-dimensional feature vector; image classification; multiSVM; neural network; pattern recognition application; wrapper approach; Accuracy; Classification algorithms; Feature extraction; Genetic algorithms; Glass; Iris; Support vector machines; Classification; Feature subset selection; GA; Neural Network; SVM Margin; feature learning; overfitting;
Conference_Titel :
Signal Processing and Integrated Networks (SPIN), 2015 2nd International Conference on
Conference_Location :
Noida
Print_ISBN :
978-1-4799-5990-7
DOI :
10.1109/SPIN.2015.7095341