DocumentCode :
704721
Title :
A quality aware technique for biometric recognition
Author :
Joshi, Piyush ; Prakash, Surya
Author_Institution :
Discipline of Comput. Sci. & Eng., Indian Inst. of Technol. Indore, Indore, India
fYear :
2015
fDate :
19-20 Feb. 2015
Firstpage :
795
Lastpage :
800
Abstract :
Noise is a very common factor for degradation of images and for better performance of any image based biometric system, enhancement of poor quality images due to noise is necessary. In most of the previously proposed techniques in the literature, it is assumed that all the images participating in the recognition process are of poor quality and an enhancement technique is blindly applied to all the images to enhance them. For example, apply Gaussian smoothing on all the images to make them noise free, however, such blind application of image enhancement degrades the quality of good images. This paper presents a quality aware technique for biometric recognition. It has utilized our previously proposed technique for image quality assessment based on noise detection. The technique first estimates the quality of the images used in the recognition and if the quality value is found to be below a certain threshold, an enhancement is applied on the image before using it for recognition. Experimental analysis has been conducted on Yale Extended Cropped Face Database. Obtained results show the effectiveness of the proposed technique.
Keywords :
biometrics (access control); face recognition; image enhancement; image segmentation; visual databases; Yale extended cropped face database; biometric recognition; image based biometric system; image degradation; image enhancement; image quality assessment; image recognition; noise detection; quality aware technique; Estimation; Image edge detection; Image enhancement; Image quality; Noise; Noise measurement; Absolute Difference Mask (ADM); Biometric Recognition; Contour; Denoise; Image quality;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing and Integrated Networks (SPIN), 2015 2nd International Conference on
Conference_Location :
Noida
Print_ISBN :
978-1-4799-5990-7
Type :
conf
DOI :
10.1109/SPIN.2015.7095437
Filename :
7095437
Link To Document :
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