DocumentCode :
706694
Title :
Monitoring in semiconductor manufacturing: A contribution to diagnosis in complex computer systems
Author :
Kotte, Gerolf ; Kabitzsch, Klaus
Author_Institution :
Systema GmbH, Klipphausen, Germany
fYear :
1999
fDate :
Aug. 31 1999-Sept. 3 1999
Firstpage :
2154
Lastpage :
2159
Abstract :
Today´s computer environments move toward higher complexity. The expansion of the local networks, the need for heterogeneous software and hardware, and the various interfaces between them, bring new challenges into computer science. The requirements for availability and reliability 24 hours per day and 7 days per week let increase the system administrator´s effort needed. Highest flexibility and self organising raises the software overall performance and is taylored to the customer´s needs in the best way possible. However, it also raises a lot of new issues in the field of tracing, trouble-shooting and fault diagnosis.
Keywords :
fault diagnosis; reliability; semiconductor industry; fault diagnosis; reliability; semiconductor manufacturing monitoring; system administrator effort; Computers; Hardware; Manufacturing; Monitoring; Production facilities; Servers; Software;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Conference (ECC), 1999 European
Conference_Location :
Karlsruhe
Print_ISBN :
978-3-9524173-5-5
Type :
conf
Filename :
7099638
Link To Document :
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