• DocumentCode
    707200
  • Title

    Performance of low melt alloys as thermal interface materials

  • Author

    Roy, Chandan K. ; Bhavnani, Sushil ; Hamilton, Mike ; Johnson, Wayne R. ; Knight, Roy W. ; Harris, Daniel K.

  • Author_Institution
    Dept. of Mech. Eng., Auburn Univ., Auburn, AL, USA
  • fYear
    2015
  • fDate
    15-19 March 2015
  • Firstpage
    235
  • Lastpage
    239
  • Abstract
    This paper focuses on using low melt alloys (LMAs) containing In, Ga, Sn, and Bi as compliant high performance thermal interface material. The investigation described herein involves in-situ thermal performance of LMAs as a function of applied pressure as well as performance evaluation after accelerated life cycle testing which includes thermal cycling from -40°C to 80°C. Testing methodologies follow ASTM D5470 protocols. Measurements show that LMAs can offer thermal interfacial resistances as low as 0.006 cm2°C/W, and their performance is highly contingent upon the quality of the mating surfaces. The issue of LMA containment and dewetting are discussed along with the solutions to mitigate them. Finally, to compare the performance of LMAs, some commercial TIMs (grease, phase change material, heat spring and thermal pads) were also tested using the same methodology and apparatus.
  • Keywords
    bismuth alloys; gallium alloys; indium alloys; life testing; thermal management (packaging); thermal resistance; tin alloys; ASTM D5470 protocols; Ga; GaIn; InBiSn; LMA containment; accelerated life cycle testing; dewetting; in-situ thermal performance; low melt alloys; temperature -40 degC to 80 degC; thermal cycling; thermal interface material; Electrical resistance measurement; Metals; Probes; Surface resistance; Thermal resistance; Uncertainty; Low Melt Alloy; Thermal Cycling; Thermal Interface Material; Thermal Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2015 31st
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/SEMI-THERM.2015.7100166
  • Filename
    7100166