DocumentCode :
707873
Title :
A parametric bootstrap method of computation of control limits of charts for skewed distributions
Author :
Lukin, Vladimir ; Yaschenko, Vladimir
Author_Institution :
Quality Control Dept., Lanck Telecom Ltd., St. Petersburg, Russia
fYear :
2015
fDate :
2-4 Feb. 2015
Firstpage :
102
Lastpage :
109
Abstract :
This article is proposing a new parametric bootstrap method of evaluation of control limits of charts for asymmetrically distributed process measurements. The proposed method modifies the authors´ approach to evaluation of control limits based on pseudorandom numbers generation (presented in [1]) by using the unbiased estimator of within-subgroup variation (pooled variance) at the step of evaluation of the distribution parameters hence decreasing the probability of false alarm in a process monitoring phase (Phase II). The use of an average statistic of within-subgroup variation increases the robustness of control limits (to the presence of exceptional variation) that allows applying the proposed method in a retrospective analysis (Phase I). The method does not require nonlinear transformations of data, which may complicate the technical interpretation and application of the results of analysis. The proposed parametric bootstrap method may be used to construct a control chart for any statistic when process measurements are distributed in accordance with any (one- or two-parameter) theoretical law. Quality variables with such distributions are found in many industries: telecommunications, electronics, mechanical engineering, etc. A comparison between the performance of charts for averages and standard deviations of the proposed method and the same charts of alternative methods1 in Phase II is made in terms of type-I and type-II error rates (using Monte Carlo simulations for process measurements distributed in accordance with the lognormal and the Weibull laws). The type-I error rates of charts for averages and standard deviations of the proposed method are closer to the required value than the type-I error rates of charts for averages and standard deviations of the alternative methods. The type-II error rates of these charts of the proposed method enable them to detect large shifts in the process location and variance very quickly.
Keywords :
Monte Carlo methods; Weibull distribution; control charts; log normal distribution; quality control; Monte Carlo simulations; Weibull law; control chart; control limits; lognormal law; parametric bootstrap method; probability distribution; process monitoring; pseudorandom numbers generation; quality variables; skewed distributions; Process control; Robustness; Statistical process control; control chart; evaluation of control limits; parametric bootstrap method; skewed distribution; type-I and type-II error rates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Young Researchers in Electrical and Electronic Engineering Conference (EIConRusNW), 2015 IEEE NW Russia
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4799-7305-7
Type :
conf
DOI :
10.1109/EIConRusNW.2015.7102241
Filename :
7102241
Link To Document :
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