• DocumentCode
    707944
  • Title

    Ringing error prevention techniques in Lucy-Richardson deconvolution process for SRAM space-time margin variation effect screening designs

  • Author

    Yamauchi, Hiroyuki ; Somha, Worawit

  • Author_Institution
    Inf. Intell. Syst., Fukuoka Inst. of Technol., Fukuoka, Japan
  • fYear
    2015
  • fDate
    25-27 March 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper proposes a ringing error avoidance technique in Lucy-Richardson-deconvolution (L-R-Dcnv) process, which is used for inversely analyzing the Random Telegraph Noise (RTN) effects on overall SRAM margin variations. The proposed ringing prevention technique successfully circumvents the ringing error by reducing the phase difference between the feedback-gain and deconvolution target distributions in L-R-Dcnv iteration cycles. This avoids any unwanted positive feedbacks, resulting in no error amplification. This effectiveness has been demonstrated with applying it to a real L-R-Dcnv analysis for the effects of the RTN on the overall SRAM margin variations, while exploiting a quicker convergence benefit of L-R-Dcnv algorithm. It has been shown that the proposed technique reduces its relative errors of the RTN deconvolution by 102~103 times compared with the conventional L-R-Dcnv. This enables to increase an accuracy of the fail-bit-count prediction based on the cumulative density function (cdf) of the convolution of the RTN with the Random Dopant Fluctuation (RDF) by over 2-orders of magnitude while accelerating its convergence speed by 7~30 times of the conventional one.
  • Keywords
    SRAM chips; integrated circuit design; integrated circuit noise; integrated circuit reliability; Lucy-Richardson deconvolution process; SRAM margin variation; cumulative density function; deconvolution target distributions; feedback gain; phase difference; random dopant fluctuation; random telegraph noise effects; ringing error avoidance technique; ringing error prevention technique; space-time margin variation effect screening designs; Accuracy; Convolution; Deconvolution; Noise; Probability density function; Random access memory; Resource description framework; Fail-bit analysis; Lucy-Richardson convolution; Random telegraph noise; Ringing error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (LATS), 2015 16th Latin-American
  • Conference_Location
    Puerto Vallarta
  • Type

    conf

  • DOI
    10.1109/LATW.2015.7102402
  • Filename
    7102402