"Safe" built-in test and tuning of boost converters using feedback loop perturbations

This paper proposes a low cost novel alternative testing approach to predict both DC and transient specifications of boost converters. Specifications such as load/line regulation are typically not measured in production because the parasitic inductances of the socket on the loadboard lead to voltage spikes that can destroy the device under test (DUT). To prevent potential damage to the DUT during production test, an alternative built-in test configuration is proposed. This test configuration reduces test time as well as test cost for DC and transient specification measurements while at the same time minimizing the probability of damage to the DUT. In the proposed test process, a sequence of carefully crafted circuit perturbations are injected into the feedback loop of the DUT. The response of the DUT to the injected perturbations is captured and used to predict specifications such as load/line regulation, ripple voltage and transient voltage peak as well as to tune the device to improve manufacturing yield. Simulation data and measurements from a hardware prototype are used to demonstrate the viability of the proposed "safe" testing and tuning approach.