Title :
Fracture mechanical modeling for the stress analysis of DBC ceramics
Author :
Gaiser, P. ; Klingler, M. ; Wilde, J.
Author_Institution :
Automotive Electron., Robert Bosch GmbH, Kusterdingen, Germany
Abstract :
Nowadays, the progress in power electronics requires the improvement of the reliability of DBC ceramics. The well-documented phenomenon of conchoidal cracking initiates failures at the metallization-ceramic interface. It is a result of the CTE mismatch between metallization and ceramics. Thermal cycling stresses lead to crack propagation which can consequently lead to failure in power devices due to diminished heat dissipation. In this paper, a novel concept was used in order to analyze the thermo-mechanical stresses in DBC ceramics under passive thermal cycling conditions by combining the Finite Element Method and fracture mechanics. Fracture mechanical parameters such as stress intensity factors and the J-integral were calculated with regard to the variation of the dimple depth, the topology of the etched metal edge and the ceramic thickness. Furthermore, this concept was applied to optimize the edge geometry of the metallization with the criterion of stress reduction at the metal-ceramic interface. The concept to minimize local stresses as a basis for reliability improvement will have to be validated experimentally. By this methodology, improvements in substrate technology for future power electronic assembly are made possible. The principle of this study presented here is the basis for a future lifetime prediction.
Keywords :
bonding processes; ceramics; cooling; copper; finite element analysis; fracture mechanics; power semiconductor devices; semiconductor device metallisation; semiconductor device reliability; solders; stress analysis; thermal stresses; CTE mismatch; Cu; DBC ceramics; J-integral; ceramic thickness; conchoidal cracking; crack propagation; dimple depth; direct bond copper ceramics; edge geometry; etched metal edge; finite element method; fracture mechanical modeling; fracture mechanical parameters; heat dissipation; lifetime prediction; local stresses; metal-ceramic interface; metallization-ceramic interface; passive thermal cycling conditions; power devices; power electronic assembly; power electronics; stress analysis; stress intensity factors; stress reduction; thermal cycling stresses; thermomechanical stresses; Predictive models; Solid modeling; Three-dimensional displays;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on
Conference_Location :
Budapest
Print_ISBN :
978-1-4799-9949-1
DOI :
10.1109/EuroSimE.2015.7103115