DocumentCode :
708100
Title :
Adequate mechanical copper modelling for 2nd level interconnect structures
Author :
Wiese, S. ; Kraemer, F.
Author_Institution :
Microintegration & Reliability, Saarland Univ., Saarbrucken, Germany
fYear :
2015
fDate :
19-22 April 2015
Firstpage :
1
Lastpage :
7
Abstract :
This paper discusses the requirements for achieving adequate modelling of the mechanical behaviour of copper interconnect structures in electronic assemblies. In this context it focuses on an experimental approach to characterise the mechanical behaviour of representative copper specimens. For this purpose the general constitutive behaviour of pure copper will be discussed, in doing so covering the specifics of elastic response, the onset of plastic flow with respect to microstructure, as well as load history, and the resulting cyclic elastic-plastic behaviour. The discussion regarding an appropriate experimental methodology starts with considerations about specific deformations of representative thin stripe specimens during a standard tensile test. In the second part this discussion is developed into design ideas for appropriate experimental instrumentation, which enables one to determine the required properties of the representative specimens.
Keywords :
assembling; copper alloys; elasticity; electronics packaging; interconnections; plastic flow; tensile testing; 2nd level interconnect structures; cyclic elastic-plastic behaviour; elastic response; electronic assembly; mechanical copper modelling; plastic flow; representative thin stripe specimen deformations; standard tensile test; Clamps; Copper; Current density; Deformable models; Strain; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on
Conference_Location :
Budapest
Print_ISBN :
978-1-4799-9949-1
Type :
conf
DOI :
10.1109/EuroSimE.2015.7103142
Filename :
7103142
Link To Document :
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