• DocumentCode
    708102
  • Title

    Numerical investigation of ceramic package/ interposer interconnects using isotropic conductive adhesive

  • Author

    Hamou, R. Faycal ; Dalsjo, Per ; Dorum, Cato ; Helland, Susanne ; Kristiansen, Helge ; Taklo, Maaike M. Visser ; Gakkestad, Jakob

  • Author_Institution
    Microsyst. & Nanotechnol. (MiNaLab), SINTEF ICT, Oslo, Norway
  • fYear
    2015
  • fDate
    19-22 April 2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The aim of this study is to investigate the applicability of using an epoxy based isotropic conductive adhesive (ICA), to mount a silicon 3D system-on chip (SoC) in a ceramic 16 pad leadless chip carrier (LCC). We present and discuss thermo-mechanical FEA simulation results obtained by implementing the viscoelastic properties of the adhesive. A generalized Maxwell model using Prony series was considered in this study. We analyse the generated strain and stress in the ICA interconnect as a function of the adhesive geometry for two high and low operating temperatures. The goal is to define an optimal volume and geometry of the cured adhesive with respect to minimized stress at the interfaces between the pads and the adhesive. The target is to reduce the risk of crack initiation and propagation caused by thermal stress by careful design.
  • Keywords
    ceramic packaging; conductive adhesives; elemental semiconductors; integrated circuit interconnections; integrated circuit packaging; silicon; system-on-chip; thermal stress cracking; ICA interconnect; Maxwell model; Prony series; Si; adhesive geometry; ceramic package; crack initiation; crack propagation; epoxy ICA; interposer interconnects; isotropic conductive adhesive; leadless chip carrier; silicon 3D system-on chip; thermal stress; thermomechanical FEA simulation; viscoelastic property; Geometry; Gold; Mechanical factors; Micromechanical devices; Periodic structures; Silicon; Three-dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on
  • Conference_Location
    Budapest
  • Print_ISBN
    978-1-4799-9949-1
  • Type

    conf

  • DOI
    10.1109/EuroSimE.2015.7103144
  • Filename
    7103144