Title :
Temperature profiles along bonding wires, revealed by the bond calculator, a new thermo-electrical simulation tool
Author :
Jung, Carl Christoph ; Silber, Christian ; Scheible, Jurgen
Author_Institution :
Robert Bosch Centre for Power Electron., Reutlingen Univ., Reutlingen, Germany
Abstract :
When a bonding wire becomes too hot, it fuses and fails. The ohmic heat that is generated in the wire can be partially dissipated to a mold package. For this cooling effect the thermal contact between wire and package is an important parameter. Because this parameter can degrade over lifetime, the fusing of a bonding wire can also occur as a long-term effect. Another important factor is the thermal power generated in the vicinity of the bond pads. Nowadays, the reliability of bond wires relies on robust dimensioning based on estimations. Smaller package sizes increase the need for better predictive methods.The Bond Calculator, a new thermo-electrical simulation tool, is able to predict the temperature profiles along bond wires of arbitrary dimensions in dependence on the applied arbitrary transient current profile, the mold surrounding the wire, and the thermal contact between wire and mold. In this paper we closely investigated the spatial temperature profiles along different bond wires in air in order to make a first step towards the experimental verification of the simulation model. We are using infrared microscopy in order to measure the thermal radiation generated along the bond wire. This is easier to perform quantitatively in air than in the mold package, because of the non-negligible absorbance of the mold material in the infrared wavelength region.
Keywords :
heat radiation; lead bonding; moulding; thermal analysis; thermal management (packaging); bond calculator; bond pads; bonding wires; cooling effect; mold package; ohmic heat; predictive methods; temperature profiles; thermal contact; thermal power; thermoelectrical simulation tool; Approximation methods; Current measurement; Detectors; Heating; Wavelength measurement;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on
Conference_Location :
Budapest
Print_ISBN :
978-1-4799-9949-1
DOI :
10.1109/EuroSimE.2015.7103148