Title :
A stacked common mode inductor with small external magnetic field susceptibility, low magnetic field emission and high differential mode inductance
Author :
Yongbin Chu ; Shuo Wang ; Ning Zhang ; Dianbo Fu
Author_Institution :
Power Electron. & Electr. Power Res. Lab. (PEEPRL), Univ. of Texas at San Antonio, San Antonio, TX, USA
Abstract :
This paper proposes a stacked common-mode (CM) inductor for electromagnetic interference (EMI) attenuation. The proposed stacked CM inductor consists of two CM inductors with identical cores and the same number of winding turns but with opposite winding directions. The proposed stacked CM inductor has three advantages. First, it is much less susceptible to external magnetic field interference than conventional CM inductors. This suppresses the EMI due to the near-magnetic-field coupling to the CM inductor. Second, the proposed winding structure effectively increases the leakage inductance of the CM inductor which enhances its ability to suppress differential-mode (DM) noise. Third, the magnetic field generated by the DM current in the stacked CM inductor is partially canceled outside of the inductor. As a result, the stacked CM inductor has lower magnetic field emission than that of a conventional CM inductor. Simulation and experimental results validate the advantages of the proposed CM inductor, which show the proposed technique greatly improves the performance of CM inductors.
Keywords :
electromagnetic fields; electromagnetic interference; electromagnetic wave attenuation; inductance; inductors; interference suppression; machine windings; magnetic susceptibility; power filters; DM current; DM noise; EMI; differential mode noise suppression; electromagnetic interference attenuation; leakage inductance; magnetic field emission; magnetic field interference; magnetic field susceptibility; near magnetic field coupling; stacked CM inductor; stacked common mode inductor; winding; Inductance; Inductors; Magnetic cores; Magnetic fields; Magnetic flux; Voltage measurement; Windings; Common mode inductor; leakage inductance; magnetic field; near magnetic field coupling; stacked inductor;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2015 IEEE
Conference_Location :
Charlotte, NC
DOI :
10.1109/APEC.2015.7104346