• DocumentCode
    708384
  • Title

    Dynamical modeling of power converters with Power Semiconductor Filter

  • Author

    Wing-to Fan ; Kuen-faat Yuen ; Chung, Henry Shu-Hung

  • Author_Institution
    Centre for Smart Energy Conversion & Utilization Res., City Univ. of Hong Kong, Hong Kong, China
  • fYear
    2015
  • fDate
    15-19 March 2015
  • Firstpage
    1999
  • Lastpage
    2006
  • Abstract
    “Power Semiconductor Filter (PSF)” has been proposed to replace passive input filter with a semiconductor device. The methodology is based on using a series-pass device (SPD) to control the input current profile of the converter. The operating point of the SPD is regulated at the boundary between the active and the saturation regions by controlling the input impedance of the converter, so that the power dissipation of the SPD is minimized and the overall efficiency is comparable with the conventional passive filter. There is a significant reduction of the physical size. This paper will present the dynamical model of the converter with PSF. The system characteristics will be demonstrated on a 75W, 90V-140V / 24V classical CCM DC-DC buck converter. Experimental results show that the model is valid up to one-fifth of the switching frequency. Moreover, modeling, design, and analysis of the entire system will be presented.
  • Keywords
    DC-DC power convertors; electric current control; passive filters; power filters; power semiconductor devices; CCM DC-DC buck converter; dynamical modeling; input current profile control; passive filter; power 75 W; power converters; power dissipation; power semiconductor filter; series-pass device; voltage 24 V; voltage 90 V to 140 V; Capacitors; Passive filters; Power electronics; Power filters; Power harmonic filters; Switching frequency; Voltage control; DC-DC power conversion; Power semiconductor filter; input filtering; power electronics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2015 IEEE
  • Conference_Location
    Charlotte, NC
  • Type

    conf

  • DOI
    10.1109/APEC.2015.7104622
  • Filename
    7104622