• DocumentCode
    708585
  • Title

    Reliability prediction method with field environment variation

  • Author

    Cai Yi-kun ; Dai Wei ; Ma Xiao-bing ; Zhao Yu

  • Author_Institution
    Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
  • fYear
    2015
  • fDate
    26-29 Jan. 2015
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper presents a novel method of field reliability prediction considering environment variation and product individual dispersion. Wiener diffusion process with drift was used for degradation modeling and a link function which presents degradation rate is introduced to model the impact of varied environment and individual dispersion. Gamma, transformed-Gamma (T-Gamma) and Normal distribution with different parameters are employed to model right-skewed, left-skewed and symmetric stress distribution in the study case. Results show obvious difference in reliability, failure intensity and failure rate compared to constant stress situation and each other. It indicates that properly modeled (proper distribution type and parameters) environmental stress is the fundamental of varied environment oriented reliability prediction. In a linear drift degradation process and Arrhenius-typ e link function situation, it is reasonable not concerning about product individual dispersion because the impact is barely small, while other situations can be studied in the same way proposed in this present paper.
  • Keywords
    environmental factors; gamma distribution; normal distribution; reliability theory; stochastic processes; Arrhenius-type link function situation; Wiener diffusion process; degradation modeling; degradation rate; environment oriented reliability prediction; environmental stress; failure intensity; failure rate; field environment variation; linear drift degradation process; normal distribution; product individual dispersion; reliability prediction method; stress situation; symmetric stress distribution; transformed-gamma distribution; Degradation; Diffusion processes; Dispersion; Gaussian distribution; Mathematical model; Reliability; Stress; degradation; distribution type and parameters; field reliability; individual dispersion; varied environment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2015 Annual
  • Conference_Location
    Palm Harbor, FL
  • Print_ISBN
    978-1-4799-6702-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2015.7105152
  • Filename
    7105152