• DocumentCode
    708601
  • Title

    Design integration of hosted payloads — Do no harm analysis

  • Author

    Kawamoto, Jack ; Dodson, Kenneth ; Kuritz, Steven

  • Author_Institution
    Reliability & Risk Manage. Dept., Aerosp. Corp., El Segundo, CA, USA
  • fYear
    2015
  • fDate
    26-29 Jan. 2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Concerns in integrating a Hosted Payload (HP) on a Host Space Vehicle (HSV) include potential propagating interface failure modes to the HSV that could jeopardize the primary mission. Failure isolation of the HSV power bus with fuses, relays, and disconnecting “non-essential loads” during a bus under-voltage survival mode is a normal design practice. Experience on recent hosted payload projects indicates this practice is not sufficient to preclude all sources of harm that a HP can create for an HSV. In a broader sense, “harm” is the result of negative effects on successful mission performance from either the HP or HSV. Unnoticed gaps between the HSV and HP in requirements, capabilities and environments are more frequent in Hosted Payload projects as the HP and HSV are developed separately. Common themes resulting in increased risk include insufficient information sharing between the HSV and HP teams; lack of knowledge of HSV requirements, configuration, mission operations and environments during HP development. Procedures and checklists were created for identifying and eliminating potential incompatibilities between the HSV/HP interfaces. A list of critical analyses to ensure interface compatibility and successful mission performance was also developed.
  • Keywords
    failure analysis; space vehicles; HP; HSV power bus; bus under-voltage survival mode; failure isolation; fuses; host space vehicle; hosted payload design integration; nonessential load disconnection; potential propagating interface failure modes; relays; Aerospace electronics; Circuit faults; Payloads; Reliability; Space vehicles; Testing; Business Intelligence in Reliability; FMEA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2015 Annual
  • Conference_Location
    Palm Harbor, FL
  • Print_ISBN
    978-1-4799-6702-5
  • Type

    conf

  • DOI
    10.1109/RAMS.2015.7105173
  • Filename
    7105173