DocumentCode :
708602
Title :
Geometric G1-Renewal process as repairable system model
Author :
Kaminskiy, Mark ; Krivtsov, Vasiliy
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fYear :
2015
fDate :
26-29 Jan. 2015
Firstpage :
1
Lastpage :
6
Abstract :
This paper considers a point process model with a monotonically decreasing or increasing ROCOF and the underlying distributions from the location-scale family, known as the geometric process [8]. In terms of repairable system reliability analysis, the process is capable of modeling various restoration types including “better-than-new”, i.e., the one not covered by the popular G-Renewal model [7]. The distinctive property of the process is that the times between successive events are obtained from the underlying distributions as the scale parameter of each is monotonically decreasing or increasing. The paper discusses properties and maximum likelihood estimation of the model for the case of the Exponential and Weibull underlying distributions.
Keywords :
Weibull distribution; exponential distribution; maintenance engineering; maximum likelihood estimation; reliability; ROCOF; Weibull distribution; exponential distribution; geometric G1-renewal process; maximum likelihood estimation; repairable system model; repairable system reliability analysis; restoration; Exponential distribution; Hazards; Maintenance engineering; Mathematical model; Maximum likelihood estimation; Reliability; Weibull distribution; aging; g-renewal; geometric process; homogeneity; non-homogeneity; rejuvenation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2015 Annual
Conference_Location :
Palm Harbor, FL
Print_ISBN :
978-1-4799-6702-5
Type :
conf
DOI :
10.1109/RAMS.2015.7105174
Filename :
7105174
Link To Document :
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