• DocumentCode
    708641
  • Title

    Modeling of T-model equivalent circuit for spiral inductors in 90 nm CMOS technology

  • Author

    Jin-Woong Jeong ; Sung-Kyu Kwon ; Jae-Nam Yu ; Seong-Yong Jang ; Sun-Ho Oh ; Choul-Young Kim ; Ga-won Lee ; Hi-Deok Lee

  • Author_Institution
    Dept. of Electron. Eng., Chungnam Nat. Univ., Daejeon, South Korea
  • fYear
    2015
  • fDate
    23-26 March 2015
  • Firstpage
    33
  • Lastpage
    36
  • Abstract
    This paper presents a newly proposed T-model of spiral inductors in 90nm radio frequency (RF) CMOS technology. Inductor modeling is one of the most difficult problems facing silicon-based RF integrated circuit designers, and the inclusion of many parameters of the inductor equivalent circuit consumes a lot of time during circuit simulation. In this paper, two models of spiral inductors were simulated to compare their agreement with the measured data from 100MHz to 10GHz. The proposed T-model had less parameters than the conventional double-π model, and also showed good agreement in the RF performance of the spiral inductors, such as quality factor (Q-factor) and inductance (L). In addition, the proposed T-model had an error rate of less than 5% with the S-parameter of measured data, similar to the double-π model.
  • Keywords
    CMOS integrated circuits; Q-factor; UHF integrated circuits; circuit simulation; equivalent circuits; field effect MMIC; inductance; inductors; integrated circuit modelling; Q-factor; T-model equivalent circuit; circuit simulation; frequency 100 MHz to 10 GHz; inductance; inductor modeling; quality factor; radio frequency CMOS technology; silicon-based RF integrated circuit; size 90 nm; spiral inductors; Inductors; Q measurement; Radio frequency; Inductance; Modeling; Quality factor; Spiral inductor; T-Model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures (ICMTS), 2015 International Conference on
  • Conference_Location
    Tempe, AZ
  • ISSN
    1071-9032
  • Print_ISBN
    978-1-4799-8302-5
  • Type

    conf

  • DOI
    10.1109/ICMTS.2015.7106104
  • Filename
    7106104