Title :
Test circuit for accurate measurement of setup/hold and access time of memories
Author_Institution :
Phys. Design Group, ARM Embedded Technol. Pvt. Ltd., Bangalore, India
Abstract :
This paper will examine the latest developments in the field of designing the test circuits for accurate measurement of setup/hold and access time of memory IPs. Measurement across all voltage domain and temperature corners, by way of the architecture discussed, has a fine resolution of just two inverter delay and correlates well with silicon within permissible range.
Keywords :
circuit testing; temperature measurement; time measurement; voltage measurement; access time measurement; circuit testing; inverter delay; memory IP; setup-hold time measurement; temperature measurement; voltage measurement; DH-HEMTs; Delays; Flip-flops; Integrated circuit interconnections; Inverters; Libraries; Semiconductor device measurement; access; hold; memory; setup; test chip;
Conference_Titel :
Microelectronic Test Structures (ICMTS), 2015 International Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4799-8302-5
DOI :
10.1109/ICMTS.2015.7106153
