Title :
Covering both stack and states while testing push-down systems
Author :
Heam, Pierre-Cyrille ; M´Hemdi, Hana
Author_Institution :
FEMTO-ST, Univ. de Franche Comte, Besancon, France
Abstract :
In this paper we address the problem of generating abstract test cases from a system modelled by a push-down automaton. Existing classical coverage criteria are based either on states, transitions or loops in the automaton. This paper is based on a known theoretical result claiming that the accessible stack configurations in a push-down automaton form a regular language. We propose a new coverage criteria based both on states and on the configurations of the stack. Experimental results on a model of the Shunting Yard Algorithm are also presented.
Keywords :
automata theory; program testing; coverage criteria; push-down automaton; push-down system testing; shunting yard algorithm; stack configurations; Adaptation models; Automata; Computational modeling; Conferences; Grammar; Polynomials; Testing; Coverage criterion; Model based Testing; Push-down automaton;
Conference_Titel :
Software Testing, Verification and Validation Workshops (ICSTW), 2015 IEEE Eighth International Conference on
Conference_Location :
Graz
DOI :
10.1109/ICSTW.2015.7107406