DocumentCode
708936
Title
A study on an approach for analysing test basis using I/O test data patterns
Author
Yumoto, Tsuyoshi ; Matsuodani, Tohru ; Tsuda, Kazuhiko
Author_Institution
Hewlett-Packard Japan, Ltd., Tokyo, Japan
fYear
2015
fDate
13-17 April 2015
Firstpage
1
Lastpage
8
Abstract
For software testing, it is important to derive test cases without lacking or duplication before test execution. Test basis to be analysed in test development process for black box testing is a functional specification. And it is less analysed under consistency rules. As a result, this has the potential to cause the lacking or duplication of test cases. This paper proposes an approach for analysing test basis focusing on data I/O in test execution to achieve analysing test basis can be more comprehensive. Moreover, in order to demonstrate this approach, an experiment is performed comparing with test cases in a real project.
Keywords
program testing; black box testing; consistency rule; functional specification; software testing; test development process; test execution; Conferences; Periodic structures; Reflection; Resource management; Software; Software testing; I/O test data patterns; Test-Categories; software testing; test analysis; test condition;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Testing, Verification and Validation Workshops (ICSTW), 2015 IEEE Eighth International Conference on
Conference_Location
Graz
Type
conf
DOI
10.1109/ICSTW.2015.7107429
Filename
7107429
Link To Document