Title :
A study on an approach for analysing test basis using I/O test data patterns
Author :
Yumoto, Tsuyoshi ; Matsuodani, Tohru ; Tsuda, Kazuhiko
Author_Institution :
Hewlett-Packard Japan, Ltd., Tokyo, Japan
Abstract :
For software testing, it is important to derive test cases without lacking or duplication before test execution. Test basis to be analysed in test development process for black box testing is a functional specification. And it is less analysed under consistency rules. As a result, this has the potential to cause the lacking or duplication of test cases. This paper proposes an approach for analysing test basis focusing on data I/O in test execution to achieve analysing test basis can be more comprehensive. Moreover, in order to demonstrate this approach, an experiment is performed comparing with test cases in a real project.
Keywords :
program testing; black box testing; consistency rule; functional specification; software testing; test development process; test execution; Conferences; Periodic structures; Reflection; Resource management; Software; Software testing; I/O test data patterns; Test-Categories; software testing; test analysis; test condition;
Conference_Titel :
Software Testing, Verification and Validation Workshops (ICSTW), 2015 IEEE Eighth International Conference on
Conference_Location :
Graz
DOI :
10.1109/ICSTW.2015.7107429