DocumentCode :
709035
Title :
Signal integrity and EMI evaluations of an RFID-Sensor tag for internet-of-things applications
Author :
Abdulhadi, Abdulhadi E. ; Mandev, Svetoslav ; Abhari, Ramesh
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, QC, Canada
fYear :
2015
fDate :
15-21 March 2015
Firstpage :
128
Lastpage :
132
Abstract :
An RFID (radio frequency identification) -Sensor tag for internet of things applications is evaluated for various signal integrity and electromagnetic radiation measures in this paper. It is found that the placement of digital circuit with respect to the radiating element has to be optimized and the entire system layout, digital and RF parts has to be co-simulated to be able to capture the detuning of operating frequency. Port impedance plots are generated via full-wave simulations to show this impact. The coupling between ports is also inspected by monitoring transmission coefficient (S21). One possible application of this sensor device is for on-body temperature measurements; therefore, back radiation of the tag and specific absorption rate (SAR) plots are reported as well.
Keywords :
Internet of Things; digital circuits; electric sensing devices; electromagnetic interference; electromagnetic wave absorption; electromagnetic wave transmission; radiofrequency identification; temperature measurement; EMI evaluations; RFID-sensor tag; SAR; back radiation; digital circuit; electromagnetic radiation; full-wave simulations; internet-of-things applications; monitoring transmission coefficient; on-body temperature measurements; radiating element; radiofrequency identification sensor; signal integrity; specific absorption rate; Antenna radiation patterns; Impedance; Integrated circuit interconnections; Layout; Radiofrequency identification; Specific absorption rate; Electromagnetic radiation; IOT; Port Crosstalk; RFID Tag; SAR; Signal Integrity; Wireless sensor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-1992-5
Type :
conf
DOI :
10.1109/EMCSI.2015.7107672
Filename :
7107672
Link To Document :
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