Title :
Comparison of TRL calibration vs. 2x thru de-embedding methods
Author :
Se-Jung Moon ; Xiaoning Ye ; Smith, Rex
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
In this paper, TRL (Through-Reflect-Multiple Lines) and 2x thru de-embedding schemes of AFR (Automatic Fixture Removal) and SFD (Smart Fixture De-embedding) are compared from various perspectives: calibration fixture design, calibration / de-embedding procedure, and the measurement accuracy. Especially for the accuracy comparison, one of our test boards which support TRL calibration up to 40 GHz was used. In order to derive a valid conclusion, the calibration / de-embedding standards were thoroughly examined and calibration stability and de-embedding accuracy were tested. The comparison showed excellent correlation in IL, RL, NEXT and FEXT over the full frequency range of measurement, while the 2x thru de-embedding method significantly simplifies the de-embedding procedures.
Keywords :
calibration; circuit stability; fixtures; printed circuit interconnections; printed circuit testing; 2x thru de-embedding methods; AFR; SFD; TRL calibration; automatic fixture removal; calibration fixture; calibration stability; de-embedding accuracy; measurement accuracy; smart fixture de-embedding; test boards; through-reflect-multiple lines; Accuracy; Calibration; Connectors; Fixtures; Frequency measurement; Loss measurement; Standards;
Conference_Titel :
Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-1992-5
DOI :
10.1109/EMCSI.2015.7107681
