Title :
Studying the effect of drilling uncertainty on signal propagation through vias
Author :
Yansheng Wang ; Penugonda, Srinath ; Yaojiang Zhang ; Ji Chen ; Jun Fan
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
A differential via structure with four varying factors are defined in this paper. The Monte Carlo (MC), stochastic collocation (SC) and design of experiments (DoE) methods are employed to quantify the drilling uncertainties in the abovementioned via structure. A comparison of the results shows that the SC method is more robust and can more efficiently and accurately estimate the mean and the standard deviation of the responses, compared to the DoE method.
Keywords :
Monte Carlo methods; design of experiments; drilling; electronics packaging; polynomial approximation; stochastic processes; three-dimensional integrated circuits; Monte Carlo methods; design of experiments methods; drilling uncertainty; signal propagation; stochastic collocation methods; Capacitance; Chaos; Electromagnetic compatibility; Impedance; Inductance; Polynomials; Stochastic processes; Design of Experiments (DoE); Latin Hypercube (LH); Monte Carlo (MC); Polynomial Chaos (PC); Stochastic Collocation (SC);
Conference_Titel :
Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-1992-5
DOI :
10.1109/EMCSI.2015.7107716
