• DocumentCode
    709062
  • Title

    M-sequence-based material characterisation

  • Author

    Monka, Carsten ; Brueckner, Sebastian ; Schoebel, Joerg

  • Author_Institution
    Microwave Eng. Lab., Tech. Univ. Braunschweig, Braunschweig, Germany
  • fYear
    2015
  • fDate
    16-18 March 2015
  • Firstpage
    21
  • Lastpage
    24
  • Abstract
    In this paper, we present a novel time domain technique for measuring the relative permittivity εr of samples based on pseudonoise test signals (M-sequences). Analog correlation is the key enabler of our system, providing high time resolution while minimising the effort required for sampling. Moreover, a linear error model is proposed and the system´s measurement uncertainty is assessed. A comparison with reference measurements of PTFE samples concludes this paper.
  • Keywords
    m-sequences; permittivity measurement; time-domain analysis; M-sequence-based material characterisation; PTFE samples; analog correlation; linear error model; pseudonoise test signals; reference measurements; relative permittivity measurement; system measurement uncertainty; time domain technique; Correlation; Delays; Measurement uncertainty; Microwave measurement; Permittivity measurement; Semiconductor device measurement; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (GeMiC), 2015 German
  • Conference_Location
    Nuremberg
  • Type

    conf

  • DOI
    10.1109/GEMIC.2015.7107742
  • Filename
    7107742
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=709062