• DocumentCode
    709161
  • Title

    Difficulty-level metric for cyber security training

  • Author

    Zequn Huang ; Chien-Chung Shen ; Doshiy, Sheetal ; Thomasy, Nimmi ; Ha Duong

  • fYear
    2015
  • fDate
    9-12 March 2015
  • Firstpage
    172
  • Lastpage
    178
  • Abstract
    Cyber security training systems work as a suitable learning environment for educating cyber analysts on how to detect and defense before real cyber attacks happen. As training is an iterative process, the assessment component not only assesses the knowledge gained by the cyber analysts, but also adjusts the difficulty of training lessons accordingly based on the analysts´ performance. In this paper, we present an attack graph-based probabilistic metric to measure lesson scenarios´ difficulty levels. Based on causal relationships between vulnerabilities in an attack graph, we apply Bayesian Reasoning to aggregate individual vulnerabilities into an probabilistic value representing the attackers success likelihood to achieve the attack goal. However, one major complication of using Bayesian Reasoning is that it does not allow for cycles, which exists in attack graphs. We identify different types of cycles in the attack graphs and propose an efficient algorithm to remove cycles while preserving cyclic influence in the probability calculation.
  • Keywords
    belief networks; computer aided instruction; inference mechanisms; probability; security of data; Bayesian reasoning; assessment component; attack graph-based probabilistic metric; causal relationships; cyber analyst education; cyber attack; cyber security training; difficulty-level metric; learning environment; lesson scenario difficulty level measurement; probability calculation; Bayes methods; Cognition; Computer security; Measurement; Training; Attack Graph; Bayesian Reasoning; Cyber Security; Difficulty-Level; Security Training System;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cognitive Methods in Situation Awareness and Decision Support (CogSIMA), 2015 IEEE International Inter-Disciplinary Conference on
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/COGSIMA.2015.7108194
  • Filename
    7108194