DocumentCode :
70924
Title :
Novel Reflectometer for Millimeter-Wave 3-D Holographic Imaging
Author :
Ghasr, Mohammad Tayeb ; Case, Joseph T. ; Zoughi, Reza
Author_Institution :
Electr. & Comput. Eng. Dept., Missouri S&T, Rolla, MO, USA
Volume :
63
Issue :
5
fYear :
2014
fDate :
May-14
Firstpage :
1328
Lastpage :
1336
Abstract :
Small, portable, and wideband millimeter-wave imaging systems are used in many nondestructive testing and imaging applications, as these systems are capable of producing high-resolution images of the interior of composite structures. Typically, systems capable of producing holographic 3-D images incorporate expensive and bulky wideband heterodyne coherent reflectometers or commercial vector network analyzers. In many nondestructive testing applications, evaluation of electrical property distribution of an object is not of interest; instead, the geometrical distribution of the object is studied. In such cases, the use of coherent reflectometers that provides referenced information about the magnitude and phase of a reflected signal is not required. Consequently, simpler reflectometers, capable of producing 3-D holographical images of objects are of great value since they reveal significant information about the object. Moreover, 3-D holographical images enable production of image slices at different depths. This paper presents a novel wideband, small, and low-cost reflectometer capable of producing holographic 3-D millimeter-wave images. The design of the reflectometer, as well as several examples of produced images in diverse materials, is provided.
Keywords :
composite materials; holography; image resolution; millimetre wave imaging; network analysers; nondestructive testing; portable instruments; reflectometers; 3D holographic imaging; composite structure; electrical property distribution evaluation; geometrical distribution; image resolution; image slice production; nondestructive testing application; portable imaging system; vector network analyzer; wideband heterodyne coherent reflectometer; wideband millimeter-wave imaging system; Antenna measurements; Apertures; Calibration; Imaging; Radar polarimetry; Vectors; Wideband; 3-D synthetic aperture radar (SAR); holography; microwave; millimeter wave;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2014.2298618
Filename :
6718120
Link To Document :
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