DocumentCode :
709261
Title :
dOSEK: the design and implementation of a dependability-oriented static embedded kernel
Author :
Hoffmann, Martin ; Lukas, Florian ; Dietrich, Christian ; Lohmann, Daniel
Author_Institution :
Friedrich Alexander Univ. (FAU), Erlangen, Germany
fYear :
2015
fDate :
13-16 April 2015
Firstpage :
259
Lastpage :
270
Abstract :
Because of shrinking structure sizes and operating voltages, computing hardware exhibits an increasing susceptibility against transient hardware faults: Issues previously only known from avionics systems, such as bit flips caused by cosmic radiation, nowadays also affect automotive and other cost-sensitive “ground-level” control systems. For such cost-sensitive systems, many software-based measures have been suggested to harden applications against transient effects. However, all these measures assume that the underlying operating system works reliably in all cases. We present software-based concepts for constructing an operating system that provides a reliable computing base even on unreliable hardware. Our design is based on two pillars: First, strict fault avoidance by static tailoring and elimination of susceptible indirections. Second, reliable fault detection by fine-grained arithmetic encoding of the complete kernel execution path. Compared to an industry-grade off-the-shelf RTOS, our resulting dOSEK kernel thereby achieves a robustness improvement by four orders of magnitude. Our results are based on extensive fault-injection campaigns that cover the entire space of single-bit faults in random-access memory and registers.
Keywords :
fault tolerant computing; operating system kernels; software reliability; computing hardware; cost-sensitive systems; dOSEK kernel; dependability-oriented static embedded kernel; fault avoidance; fault-injection; fine-grained arithmetic encoding; kernel execution path; operating system; random-access memory; registers; reliable computing; reliable fault detection; software-based concepts; software-based measures; static tailoring; transient effects; transient hardware faults; Data structures; Hardware; Kernel; Registers; Robustness; System analysis and design; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Real-Time and Embedded Technology and Applications Symposium (RTAS), 2015 IEEE
Conference_Location :
Seattle, WA
Type :
conf
DOI :
10.1109/RTAS.2015.7108449
Filename :
7108449
Link To Document :
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