Title :
Heat resistant Bi-Ag-X solders for power IC die attachment
Author :
Jenn-Ming Song ; Zhang-Hong Chang
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Chung Hsing Univ., Taichung, Taiwan
Abstract :
One of the urgent issues in electronic packaging is the die-attachment technique for high power ICs, which needs to withstand high operation temperature up to 250°C. In this study, the microstructure and mechanical properties of the joints between high temperature Pb-free solders (Bi-11Ag, Bi-Ag-X, Zn-30Sn and Sn-18Sb-5Ag) and Cu substrates were investigated. To evaluate the mechanical performance at elevated temperatures, shear tests from room temperature to 250°C were carried out. Experimental results show that for all the test temperatures, Bi-Ag-X joints exhibited superior shear strength than Bi-11Ag and the others. This can be ascribed to the higher solidus temperature of Bi-Ag system, and the strengthening effect of intermetallic compounds on the joints and the interface as well.
Keywords :
copper; integrated circuit packaging; microassembling; power integrated circuits; silver; solders; thermal management (packaging); thermal resistance; tin compounds; zinc compounds; Cu; Sn-Ag; Zn-Sn; heat resistant Bi-Ag-X solders; intermetallic compounds; lead-free solders; mechanical property; microstructure property; power IC die attachment; room temperature; shear strength; shear test; temperature 250 C; Joints; Lead; Microstructure; Powders; Substrates; Temperature;
Conference_Titel :
Electronics Packaging and iMAPS All Asia Conference (ICEP-IACC), 2015 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-4-9040-9012-1
DOI :
10.1109/ICEP-IAAC.2015.7111075