• DocumentCode
    709667
  • Title

    Analysis of LED wire bonding process using arbitrary Lagrangian-Eulerian and equilibrium mesh smoothing algorithm

  • Author

    Che-Chia Yang ; Chia-Chi Tsai ; Yen-Fu Su ; Kuo-Ning Chiang

  • Author_Institution
    Adv. Microsyst. Packaging & Nano-Mech. Res. Lab., Hsinchu, Taiwan
  • fYear
    2015
  • fDate
    14-17 April 2015
  • Firstpage
    787
  • Lastpage
    790
  • Abstract
    In light emitting diode (LED) packaging, wire bonding is used to connect the power of chip. The contact force during thermosonic bonding process might be able to make the failures, such as pad peeling, cracking, and delamination. This study presents an effective simulation technology with bonding wire geometry validation for the LED wire bonding process. An axisymmetric finite element (FE) model using explicit method with a second level accuracy arbitrary Lagrangian-Eulerian (ALE) algorithm is constructed in this research. In addition, ALE using the equilibrium smoothing algorithm can make the contact behavior and geometric shape of bonding wire be the same as experimental results, and element distortion would be reduced.
  • Keywords
    finite element analysis; lead bonding; light emitting diodes; semiconductor device packaging; tape automated bonding; ALE algorithm; FE model; LED wire bonding process analysis; axisymmetric finite element model; bonding wire geometry; chip power; contact force; cracking; delamination; element distortion; equilibrium mesh smoothing algorithm; geometric shape; light emitting diode packaging; pad peeling; second level accuracy arbitrary Lagrangian-Eulerian algorithm; thermosonic bonding process; Bonding; Finite element analysis; Gold; Light emitting diodes; Smoothing methods; Wires; Arbitrary Lagrangian-Eulerian (ALE); Light emitting diode (LED); Mesh Smoothing Algorithm; Remesh; Wire Bonding Process;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging and iMAPS All Asia Conference (ICEP-IACC), 2015 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-4-9040-9012-1
  • Type

    conf

  • DOI
    10.1109/ICEP-IAAC.2015.7111117
  • Filename
    7111117