DocumentCode :
709681
Title :
Novel impedance controllable testing socket for high speed/frequency package
Author :
Kuan-Yi Cheng ; Sung-Mao Wu ; Lung-Shu Huang ; Chen-Chang Cheng ; Yen-Tang Chang
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Kaohsiung, Kaohsiung, Taiwan
fYear :
2015
fDate :
14-17 April 2015
Firstpage :
882
Lastpage :
885
Abstract :
In the design of traditional IC only take into the effect of IC and load board, but ignored the effect of testing sockets during testing. With testing frequency get higher and higher, signal will easily have signal integrity (SI) problem. Higher frequency couldn´t achieve goal because of the loss on the transmission path. And the most easily part cause loss was the impedance matched socket. To overcome the signal loss problem, this project proposed an ideal design of sockets. The reasons of signal loss are impedance or the long path. We can only try to shrink the path to overcome the later. And this project is to improve impedance mismatched problem. QFN (Quad Flat No Leads) for example, traditional sockets placed copper cube and thermal ground pin in the middle of sockets to release heat. And placed I/O pins under IC´s leads. Signal will pass through pogo pin and reach the load board. But signal will reflect because of impedance mismatched. This project use transmission line theory to match the impedance by change the distance between copper and I/O pin.
Keywords :
electric connectors; integrated circuit design; integrated circuit packaging; I/O pins; IC design; QFN; SI problem; copper cube; high speed-frequency package; impedance controllable testing socket; impedance matched socket; load board; quad flat no leads; signal integrity problem; signal loss problem; testing frequency; thermal ground pin; transmission line theory; transmission path; Copper; Impedance; Loss measurement; Probes; Sockets; Testing; Transmission line measurements; Impedance matching; signal analysis; transmission line theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging and iMAPS All Asia Conference (ICEP-IACC), 2015 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-4-9040-9012-1
Type :
conf
DOI :
10.1109/ICEP-IAAC.2015.7111140
Filename :
7111140
Link To Document :
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