Critical charge dependence of correlation of different neutron sources for soft error testing

Author

Mori, Hiroko ; Uemura, Taiki ; Matsuyama, Hideya ; Abe, Shin-ichiro ; Watanabe, Yukinobu

Author_Institution

Socionext, Kanagawa, Japan

fYear

2015

fDate

19-23 April 2015

Abstract

We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test facility´s spectrum to that with the JEDEC spectrum is provided as a function of critical charge. This ration is used for estimation of the SER at sea level from the SER measured at test facilities. Single event upset (SEU) cross-sections necessary in derivation of the SER ratio are given by a multi-scale (particle transport and 3D TCAD) Monte Carlo simulation. Finally, the SER ratio is verified through acceleration tests in three facilities.

Keywords

Monte Carlo methods; neutron sources; radiation hardening (electronics); 3D TCAD simulation; JEDEC spectrum; SER deviation; SER ratio; acceleration test facilities; critical charge dependence; critical charge function; multiscale Monte Carlo simulation; neutron source; single-event upset cross-section; soft error rate deviation; soft error testing; test facility spectrum; transport simulation; Acceleration; Neutrons; Random access memory; Sea measurements; Single event upsets; Test facilities; Three-dimensional displays; Soft error; acceleration test; critical charge; cross-section; neutron;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium (IRPS), 2015 IEEE International

Conference_Location

Monterey, CA

Type

conf

DOI

10.1109/IRPS.2015.7112678

Filename

7112678