Title :
Critical charge dependence of correlation of different neutron sources for soft error testing
Author :
Mori, Hiroko ; Uemura, Taiki ; Matsuyama, Hideya ; Abe, Shin-ichiro ; Watanabe, Yukinobu
Author_Institution :
Socionext, Kanagawa, Japan
Abstract :
We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test facility´s spectrum to that with the JEDEC spectrum is provided as a function of critical charge. This ration is used for estimation of the SER at sea level from the SER measured at test facilities. Single event upset (SEU) cross-sections necessary in derivation of the SER ratio are given by a multi-scale (particle transport and 3D TCAD) Monte Carlo simulation. Finally, the SER ratio is verified through acceleration tests in three facilities.
Keywords :
Monte Carlo methods; neutron sources; radiation hardening (electronics); 3D TCAD simulation; JEDEC spectrum; SER deviation; SER ratio; acceleration test facilities; critical charge dependence; critical charge function; multiscale Monte Carlo simulation; neutron source; single-event upset cross-section; soft error rate deviation; soft error testing; test facility spectrum; transport simulation; Acceleration; Neutrons; Random access memory; Sea measurements; Single event upsets; Test facilities; Three-dimensional displays; Soft error; acceleration test; critical charge; cross-section; neutron;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2015 IEEE International
Conference_Location :
Monterey, CA
DOI :
10.1109/IRPS.2015.7112678