Title :
Workload-dependent BTI analysis in a processor core at high level
Author :
Heron, O. ; Sandionigi, C. ; Piriou, E. ; Mbarek, S. ; Huard, V.
Author_Institution :
Comput. & Design Environ. Lab., CEA, Gif-sur-Yvette, France
Abstract :
This work presents a software tool that enables joint architecture simulation and estimation of ageing-induced timing drifts at register-transfer level (RTL). The objective is to enable design exploration of processor microarchitecture under ageing constraint. The tool makes the bridge between user application, micro-architecture design, PVT corner and device-level degradation model. The environment will aid design engineers to apply early software and architecture optimizations at RTL for a better power consumption, performance and failure rate tradeoff.
Keywords :
ageing; circuit simulation; failure analysis; integrated circuit design; integrated circuit reliability; low-power electronics; microprocessor chips; negative bias temperature instability; PVT corner; ageing-induced timing drifts; architecture optimizations; device-level degradation model; failure rate tradeoff; joint architecture simulation; microarchitecture design; power consumption; processor core; processor microarchitecture; register-transfer level; user application; workload-dependent BTI analysis; Aging; Approximation methods; Benchmark testing; Computer architecture; Degradation; Logic gates; Timing; NBTI; RISC processor; RTL; Simulation;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2015 IEEE International
Conference_Location :
Monterey, CA
DOI :
10.1109/IRPS.2015.7112784