Title :
Techniques for heavy ion microbeam analysis of FPGA SER sensitivty
Author :
Evans, Adrian ; Alexandrescu, Dan ; Ferlet-Cavrois, Veronique ; Voss, Kay-Obbe
Author_Institution :
IROC Technol., Grenoble, France
Abstract :
Using the heavy-ion micro-probe facility at GSI in Darmstadt, individual heavy ions can be targeted at specific locations on a die. Circuits to measure SEUs in flip-flops and RAMs, SETs in combinatorial logic and glitches in PLLs were developed and tested. Detailed results for a study of the 130 nm ProASIC3L FPGA tested under Au (94 MeV/mg /cm2) and Ti (19 MeV/mg / cm2) ions are presented.
Keywords :
application specific integrated circuits; field programmable gate arrays; flip-flops; integrated circuit testing; phase locked loops; radiation hardening (electronics); random-access storage; Darmstadt; FPGA SER sensitivty; GSI; PLL; ProASIC3L FPGA testing; RAM; SET; combinatorial logic; flip-flop; heavy ion microbeam analysis; size 130 nm; Clocks; Field programmable gate arrays; Flip-flops; Gold; Ions; Latches; Phase locked loops; FPGA; Phase Loced Loop (PLL); micro-probe; single event transient (SET); single event upset (SEU);
Conference_Titel :
Reliability Physics Symposium (IRPS), 2015 IEEE International
Conference_Location :
Monterey, CA
DOI :
10.1109/IRPS.2015.7112826
