• DocumentCode
    710365
  • Title

    A first-order low distortion sigma-delta modulator using split DWA technique and SAR quantizer

  • Author

    Tien-Feng Hsu ; Chun-Po Huang ; I-Jen Chao ; Soon-Jyh Chang

  • Author_Institution
    Dept. of EE, Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a comparator-based OTA first-order discrete-time low-distortion sigma-delta modulator. A split data weighted averaging (DWA) algorithm logic is proposed to release the heavy burden of digital circuit while a 6 bit DAC is implemented in this work. In addition, a comparator-based OTA is used to reduce the power consumption. On the top of that, to achieve lower power consumption, a power efficient SAR quantizer with embedded analog passive adder is proposed to eliminate additional operational amplifier for summation. The modulator core occupies an active area of 0.0275 mm2 in TSMC 90-nm 1P9M CMOS process. Experimental results show that the proposed modulator achieves 59.90 dB SNDR with 0.58 mW power consumption under 1.0 V supply voltage, an OSR of 16 at 65 MHz sampling frequency and 500kHz input frequency.
  • Keywords
    CMOS analogue integrated circuits; adders; comparators (circuits); digital-analogue conversion; operational amplifiers; passive networks; radiofrequency amplifiers; radiofrequency integrated circuits; sigma-delta modulation; DAC; OTA; TSMC 1P9M CMOS process; comparator; data weighted averaging; digital circuit; embedded analog passive adder; first-order low distortion sigma-delta modulator; frequency 500 kHz; frequency 65 MHz; noise figure 59.90 dB; operational amplifier; power 0.58 mW; power consumption; power efficient SAR quantizer; size 90 nm; split DWA technique; voltage 1.0 V; word length 6 bit; Adders; Capacitors; Modulation; Power demand; Solid state circuits; Switches; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/VLSI-DAT.2015.7114518
  • Filename
    7114518