• DocumentCode
    710373
  • Title

    An algorithmic error-resilient scheme for robust LDPC decoding

  • Author

    Huai-Ting Li ; Ding-Yuan Lee ; Kun-Chih Chen ; Wu, An-Yeu Andy

  • Author_Institution
    Grad. Inst. Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    To fit into multiple communication standards, flexible Low-Density Parity-Check (LDPC) decoding is desirable to be implemented in a chip multiprocessor (CMP) system. However, reliability issues, such as soft errors and timing errors, are severer in future advanced CMP systems when CMOS technology scale. Therefore, enhancing error resilience for a CMP system becomes an important design issue. In this paper, we propose a design methodology to achieve a robust LDPC decoding based on algorithmic error-resilient method. We firstly analyze the performance degradation caused by the soft errors which occur in the computing units (check node units and bit node units), and then explore the inherent error-tolerant characteristic of LDPC decoding algorithm. In our proposed method, we exploit some characteristic distribution or behavior in the operations of the LDPC decoding algorithm to validate the computing results. The experimental results show that the proposed algorithmic error resilience can approach the error-free decoder while facing high injected soft-error rate of 10-3 in computing units, but with only 6.07% computational overhead. To the best of our knowledge, this is the first discussion about the LDPC decoding algorithm in terms of soft errors in computing units.
  • Keywords
    decoding; integrated circuit reliability; microprocessor chips; parity check codes; radiation hardening (electronics); CMOS technology scale; advanced CMP systems; algorithmic error-resilient scheme; bit node units; check node units; chip multiprocessor system; computational overhead; computing units; design methodology; error-free decoder; flexible low-density parity-check decoding; multiple-communication standards; performance degradation analysis; reliability issue; robust LDPC decoding; soft error rate; timing errors; Algorithm design and analysis; Decoding; Error analysis; Iterative decoding; Robustness; Algorithm-level design; Error resilience; LDPC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/VLSI-DAT.2015.7114527
  • Filename
    7114527