DocumentCode :
710373
Title :
An algorithmic error-resilient scheme for robust LDPC decoding
Author :
Huai-Ting Li ; Ding-Yuan Lee ; Kun-Chih Chen ; Wu, An-Yeu Andy
Author_Institution :
Grad. Inst. Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2015
fDate :
27-29 April 2015
Firstpage :
1
Lastpage :
4
Abstract :
To fit into multiple communication standards, flexible Low-Density Parity-Check (LDPC) decoding is desirable to be implemented in a chip multiprocessor (CMP) system. However, reliability issues, such as soft errors and timing errors, are severer in future advanced CMP systems when CMOS technology scale. Therefore, enhancing error resilience for a CMP system becomes an important design issue. In this paper, we propose a design methodology to achieve a robust LDPC decoding based on algorithmic error-resilient method. We firstly analyze the performance degradation caused by the soft errors which occur in the computing units (check node units and bit node units), and then explore the inherent error-tolerant characteristic of LDPC decoding algorithm. In our proposed method, we exploit some characteristic distribution or behavior in the operations of the LDPC decoding algorithm to validate the computing results. The experimental results show that the proposed algorithmic error resilience can approach the error-free decoder while facing high injected soft-error rate of 10-3 in computing units, but with only 6.07% computational overhead. To the best of our knowledge, this is the first discussion about the LDPC decoding algorithm in terms of soft errors in computing units.
Keywords :
decoding; integrated circuit reliability; microprocessor chips; parity check codes; radiation hardening (electronics); CMOS technology scale; advanced CMP systems; algorithmic error-resilient scheme; bit node units; check node units; chip multiprocessor system; computational overhead; computing units; design methodology; error-free decoder; flexible low-density parity-check decoding; multiple-communication standards; performance degradation analysis; reliability issue; robust LDPC decoding; soft error rate; timing errors; Algorithm design and analysis; Decoding; Error analysis; Iterative decoding; Robustness; Algorithm-level design; Error resilience; LDPC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on
Conference_Location :
Hsinchu
Type :
conf
DOI :
10.1109/VLSI-DAT.2015.7114527
Filename :
7114527
Link To Document :
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