Title :
Case study of process and design performance debugging with Digital Speed Sensor
Author :
Chao-Wen Tzeng ; Yin-Yen Chen ; Jih-Nung Lee ; Shu-Yi Kao
Author_Institution :
Realtek Semicond. Corp., Hsinchu, Taiwan
Abstract :
Using speed sensor to find out the unexpected process variation and design performance degradation is getting more and more attention. In this paper, we demonstrate the industrial case of identifying process variation, with the power of in-house developed DSS (Digital Speed Sensor). The identification result is validated by TEM (Transmission Electron Microscopy). In addition, by using DSS, we can observe how the test environment results in design performance degradation, not only during the CP (Circuit Probe) test but also the board-level test.
Keywords :
circuit testing; digital instrumentation; sensors; transmission electron microscopy; velocity measurement; TEM; board-level test; circuit probe test; design performance debugging; design performance degradation; digital speed sensor; transmission electron microscopy; Decision support systems; Libraries; Monitoring; Probes; Ring oscillators; Temperature measurement; Temperature sensors; Design Performance Debugging; Process Variation; Speed Sensor;
Conference_Titel :
VLSI Design, Automation and Test (VLSI-DAT), 2015 International Symposium on
Conference_Location :
Hsinchu
DOI :
10.1109/VLSI-DAT.2015.7114548
