DocumentCode
710639
Title
Special session 8C: E.J. McCluskey doctoral thesis award semi-final
Author
Portolan, M. ; Huang, K.
Author_Institution
TIMA Laboratory, France
fYear
2015
fDate
27-29 April 2015
Firstpage
1
Lastpage
2
Abstract
Named after Prof. E.J. McCluskey, a key contributor to the field of test technology, the 2015 TTTC´s Doctoral Thesis Award serves the purpose to i) promote the most impactful doctoral student work, ii) provide the students with the exposure to the community and the prospective employers, and iii) support interaction between academia and industry in the field of test technology. TTTC´s E.J. McCluskey Best Doctoral Thesis Award will be given to the winning student of the doctoral student contest and his or her advisor. The award consists of a certificate, an honorarium and an invitation to submit a paper on the presented work to the IEEE Design & Test magazine.
Keywords
Awards activities; Communities; Industries; Medical services; Reliability; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Conference_Location
Napa, CA, USA
Type
conf
DOI
10.1109/VTS.2015.7116285
Filename
7116285
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