• DocumentCode
    710639
  • Title

    Special session 8C: E.J. McCluskey doctoral thesis award semi-final

  • Author

    Portolan, M. ; Huang, K.

  • Author_Institution
    TIMA Laboratory, France
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Named after Prof. E.J. McCluskey, a key contributor to the field of test technology, the 2015 TTTC´s Doctoral Thesis Award serves the purpose to i) promote the most impactful doctoral student work, ii) provide the students with the exposure to the community and the prospective employers, and iii) support interaction between academia and industry in the field of test technology. TTTC´s E.J. McCluskey Best Doctoral Thesis Award will be given to the winning student of the doctoral student contest and his or her advisor. The award consists of a certificate, an honorarium and an invitation to submit a paper on the presented work to the IEEE Design & Test magazine.
  • Keywords
    Awards activities; Communities; Industries; Medical services; Reliability; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2015 IEEE 33rd
  • Conference_Location
    Napa, CA, USA
  • Type

    conf

  • DOI
    10.1109/VTS.2015.7116285
  • Filename
    7116285