Title :
UPF-based formal verification of low power techniques in modern processors
Author :
Sharafinejad, Reza ; Alizadeh, Bijan ; Fujita, Masahiro
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
Abstract :
Ensuring from the correctness of system on a chip (SoC) designs after the insertion of high level power management strategies that are disconnected from low level controlling signals, is a serious challenge to be addressed. This paper proposes a methodology for formally verifying dynamic power management strategies on implementations in modern processors. The proposed methodology is based on correspondence checking between a golden model without power features as a specification and a pipelined implementation with various power management strategies. Our main contributions in this paper are: 1) extracting Power Management Unit (PMU) from Unified Power Format (UPF) and Global Power Management (GPM), 2) automatically integrating PMU into the implementation and 3) checking the correspondence between two models with efficient symbolic simulation. The experimental results show that our method enables the designers to verify the designs with different power management strategies up to several thousands of lines of Register Transfer Level (RTL) code in minutes. In comparison with existing methods such as [7], our method reduces the number of state variables, the number of clauses, the number of symbolic simulation steps, and the CPU time by 11.04×, 17.57×, 2.08× and 13.71×, respectively.
Keywords :
electronic engineering computing; formal verification; integrated circuit design; low-power electronics; microprocessor chips; system-on-chip; CPU time; GPM; PMU; RTL code; SoC designs; UPF-based formal verification; correspondence checking; dynamic power management strategies; global power management; golden model; high level power management strategies; low level controlling signals; low power techniques; modern processors; pipelined implementation; power management unit; register transfer level code; state variables; symbolic simulation; system on a chip design; unified power format; ISO; Phasor measurement units; Power control; Power supplies; Program processors; Registers; Formal verification; global power management (GPM); power management unit (PMU); unified power format (UPF);
Conference_Titel :
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Conference_Location :
Napa, CA
DOI :
10.1109/VTS.2015.7116288