• DocumentCode
    710655
  • Title

    Special session 12B: Panel: IOT - Reliable? Secure? Or death by a billion cuts?

  • Author

    Kodakara, Sreekumar V. ; Natarajan, Suriya

  • Author_Institution
    Intel, USA
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The era of Internet-Of-Things, or IOT - ubiquitous connected components, shared across an intelligent communication medium, and analyzed by massive storage and analysis “clouds” - has begun. With development of deep integration and sensor technologies, very high speed network connectivity, and huge server farms that can provide 24×7 service, the ability to monitor, process and optimize our work and personal life is at our door step.
  • Keywords
    Electric potential; High-speed networks; Logic gates; Reliability; Security; Servers; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2015 IEEE 33rd
  • Conference_Location
    Napa, CA, USA
  • Type

    conf

  • DOI
    10.1109/VTS.2015.7116304
  • Filename
    7116304
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=710655