DocumentCode :
710655
Title :
Special session 12B: Panel: IOT - Reliable? Secure? Or death by a billion cuts?
Author :
Kodakara, Sreekumar V. ; Natarajan, Suriya
Author_Institution :
Intel, USA
fYear :
2015
fDate :
27-29 April 2015
Firstpage :
1
Lastpage :
1
Abstract :
The era of Internet-Of-Things, or IOT - ubiquitous connected components, shared across an intelligent communication medium, and analyzed by massive storage and analysis “clouds” - has begun. With development of deep integration and sensor technologies, very high speed network connectivity, and huge server farms that can provide 24×7 service, the ability to monitor, process and optimize our work and personal life is at our door step.
Keywords :
Electric potential; High-speed networks; Logic gates; Reliability; Security; Servers; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Conference_Location :
Napa, CA, USA
Type :
conf
DOI :
10.1109/VTS.2015.7116304
Filename :
7116304
Link To Document :
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