DocumentCode :
71071
Title :
The Power of IEC 61850: Bus-Transfer and Load-Shedding Applications
Author :
Sevov, Lubomir ; Zhao, Tony W. ; Voloh, Ilia
Author_Institution :
NPI, GE Digital Energy, Markham, ON, Canada
Volume :
19
Issue :
1
fYear :
2013
fDate :
Jan.-Feb. 2013
Firstpage :
60
Lastpage :
67
Abstract :
The new communications technology and the newly developed International Electrotechnical Commission (IEC) standard IEC 61850 [1], for generic object-oriented substation events (GOOSE), bring many advantages to industrial protection and control applications. Some of the applications benefiting the most are those associated with the bus-transfer and load-shedding schemes, together with more beneficial communication-assisted schemes, like zone interlocking, fast bus trip, and arc-flash reduction. Some intelligent electronic devices (IEDs) are equipped with more than one high-speed Ethernet channel to transmit or receive hundreds of discrete and analog values. This offers two very big advantages over the copper-wired IEDs: 1) a single pair of network cables, either copper or fiber, can substitute for a big number of standard copper wires and 2) using two or more network channels provides very good data exchange redundancy and hence higher reliability. The savings from substituting a large number of copper wires with a communication medium like Ethernet copper twisted paired cables, or a pair of fiber-optic cables, can be easily calculated.
Keywords :
IEC standards; copper; load shedding; substations; wires; Cu; Ethernet copper twisted paired cables; GOOSE; IEC 61850; International Electrotechnical Commission standard; bus-transfer; copper wires; copper-wired IED; data exchange redundancy; fiber-optic cables; generic object-oriented substation events; intelligent electronic devices; load-shedding applications; network cables; network channels; standard copper wires; IEC standards; Load control; Optical fiber networks; Redundancy; Relays; Voltage control;
fLanguage :
English
Journal_Title :
Industry Applications Magazine, IEEE
Publisher :
ieee
ISSN :
1077-2618
Type :
jour
DOI :
10.1109/MIAS.2012.2215641
Filename :
6355813
Link To Document :
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