DocumentCode :
71096
Title :
GaN Switches in Pulsed Power: A Comparative Study
Author :
Zucker, Oved S. F. ; Yu, Paul K. L. ; Yeuan-Ming Sheu
Author_Institution :
Polarix Corp., Annandale, VA, USA
Volume :
42
Issue :
5
fYear :
2014
fDate :
May-14
Firstpage :
1295
Lastpage :
1303
Abstract :
Present research in widebandgap semiconductors is concentrated predominantly in continuous-wave applications. While their applicability for pulsed power is recognized, little work has been done in taking advantage of the individual characteristics, such as the large drift velocities, of the candidate materials. Analysis of the relative merits of the key semiconductor technologies - Si, GaAs, SiC, and GaN - in the pulsed-power regime is presented, including limitations associated with majority carrier operation and thermal transients. We will also discuss a GaN photoconductor with a vertical topology, which is particularly well suited to higher current applications and also is geometrically more applicable for integration to transmission lines without degrading the high blocking field (2 MV/cm) now available. The relation between the blocking voltage and conduction current typical of majority carrier operation is analyzed and we will show how optical carrier generation provides the much higher switching power associated with bipolar operation.
Keywords :
III-V semiconductors; gallium compounds; photoconducting switches; semiconductor switches; wide band gap semiconductors; GaAs; GaN; GaN photoconductor; GaN switches; SiC; bipolar operation; comparative study; conduction current; large drift velocities; majority carrier operation; optical carrier generation; pulsed power; pulsed-power regime; semiconductor technologies; switching power; thermal transients; vertical topology; widebandgap semiconductors; Electron mobility; Gallium nitride; Heating; Optical switches; Silicon; Drift velocity; GaN; photoconductor (PC); pulsed power; pulsed power.;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2014.2312398
Filename :
6785989
Link To Document :
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