Title :
Moving from thin films to atomic layers — Atomic layer etching
Author :
Huffman, Craig ; Joseph, Eric A. ; PapaRao, Satyavolu
Author_Institution :
SEMATECH, Albany, NY, USA
Abstract :
Summary form only given. Controlled layer by layer material removal will be required for device fabrication in the future. Atomic level etch is a promising path to answer the processing demands of thin high mobility channel devices on the angstrom scale. Self-limiting reactions, discrete reaction & activation steps, or extremely low ion energy etch plasmas are some of the pathways being pursued for precise sub-nanometer material removal. Critical etch applications that require atomic layer control will be discussed, and promising approaches towards atomic layer etch will be reviewed in this talk.
Keywords :
etching; thin films; activation steps; atomic layer control; atomic layer etching; discrete reaction; layer material removal; low ion energy etch plasmas; self-limiting reactions; thin films; thin high mobility channel devices;
Conference_Titel :
VLSI Technology, Systems and Application (VLSI-TSA), 2015 International Symposium on
Conference_Location :
Hsinchu
DOI :
10.1109/VLSI-TSA.2015.7117594