• DocumentCode
    711042
  • Title

    Moving from thin films to atomic layers — Atomic layer etching

  • Author

    Huffman, Craig ; Joseph, Eric A. ; PapaRao, Satyavolu

  • Author_Institution
    SEMATECH, Albany, NY, USA
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Summary form only given. Controlled layer by layer material removal will be required for device fabrication in the future. Atomic level etch is a promising path to answer the processing demands of thin high mobility channel devices on the angstrom scale. Self-limiting reactions, discrete reaction & activation steps, or extremely low ion energy etch plasmas are some of the pathways being pursued for precise sub-nanometer material removal. Critical etch applications that require atomic layer control will be discussed, and promising approaches towards atomic layer etch will be reviewed in this talk.
  • Keywords
    etching; thin films; activation steps; atomic layer control; atomic layer etching; discrete reaction; layer material removal; low ion energy etch plasmas; self-limiting reactions; thin films; thin high mobility channel devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems and Application (VLSI-TSA), 2015 International Symposium on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/VLSI-TSA.2015.7117594
  • Filename
    7117594