DocumentCode :
711136
Title :
Improving aerospace electronics by systemic early failure analysis during development and modification
Author :
Verbitsky, David E.
Author_Institution :
Alefa-EEQRA, Edison, NJ, USA
fYear :
2015
fDate :
7-14 March 2015
Firstpage :
1
Lastpage :
15
Abstract :
A three-stage systemic early failure analysis (SEFA) methodology is proposed. It addresses prevalent failures occurring during development using diverse experimental and theoretical techniques and structures. SEFA provides a flexible yet consistent effective and efficient approach leading to a rare combination of unified high quality, reliability, safety, improvement and profitability (QIP). The SEFA impact is maximized when a proper process is implemented at hi-tech mass-produced demanding electronics business. Practical and specific SEFA techniques, classifications and examples substantiate and illustrate the proposed approach.
Keywords :
air safety; avionics; failure analysis; reliability; SEFA; aerospace electronics improvement; hi-tech mass produced demanding electronics business; reliability; safety; systemic early failure analysis; Materials reliability; Metrology; Process control; Qualifications; Quality function deployment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Conference, 2015 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
978-1-4799-5379-0
Type :
conf
DOI :
10.1109/AERO.2015.7118892
Filename :
7118892
Link To Document :
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