DocumentCode :
711848
Title :
Fault Diagnosis Based on Wavelet Entropy Feature Extraction and Information Fusion
Author :
Vazifeh, Mohammadreza ; Hosseinabadi, Farzaneh Abbasi
Author_Institution :
Sch. of Comput., Wuhan Univ. of Technol., Wuhan, China
fYear :
2015
fDate :
24-26 April 2015
Firstpage :
234
Lastpage :
238
Abstract :
It is important to reduce keeping costs and hold up unscheduled downtimes for machinery. So knowledge of what, where and how faults occur is very important. Fault detection and diagnosis are necessary for implementing CBM (condition base model) Best classifier systems which are considered as one of the most significant advances in pattern classification in recent years. We exposure new algorithm in this paper, this new algorithm have 3 steps. In the First step used wavelet Entropy for make wavelet tree with coefficient in each node. In second step using wavelet tree fused data with maximum coefficient in wavelet tree and in step three with output of fusion function we classification this fusion data by kernel method. This algorithm have best time study because the time of search algorithms is, D is depth of wavelet tree. Our proposed fusion strategies take into account that a Wavelet-Entropy by finding the optimal kernel size with maximal margin. Then a kernel Machine classifier is trained.
Keywords :
condition monitoring; entropy; fault diagnosis; feature extraction; machinery; mechanical engineering computing; pattern classification; search problems; sensor fusion; trees (mathematics); wavelet transforms; CBM; classifier systems; condition base model; fault detection; fault diagnosis; fusion data classification; information fusion; keeping cost reduction; kernel machine classifier; kernel method; machinery; pattern classification; search algorithms; unscheduled downtimes; wavelet entropy feature extraction; wavelet tree; Entropy; Fault diagnosis; Feature extraction; Kernel; Mathematical model; Wavelet packets; Fault diagnosis; Information Fusion; Wavelet-Packed Entropy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Science and Control Engineering (ICISCE), 2015 2nd International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-6849-0
Type :
conf
DOI :
10.1109/ICISCE.2015.59
Filename :
7120599
Link To Document :
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