• DocumentCode
    71222
  • Title

    Bump and Underfill Effects on Thermal Behaviors of Flip-Chip LED Packages: Measurement and Modeling

  • Author

    Ming-Yi Tsai ; Chung-Yi Tang ; Chia-Yi Yen ; Liann-Be Chang

  • Author_Institution
    Dept. of Mech. Eng., Chang Gung Univ., Taoyuan, Taiwan
  • Volume
    14
  • Issue
    1
  • fYear
    2014
  • fDate
    Mar-14
  • Firstpage
    161
  • Lastpage
    168
  • Abstract
    The goal of this paper is to experimentally and numerically study the thermal behaviors of flip-chip (FC) light-emitting diode (LED) packages with and without underfills and, furthermore, to compare it with conventional wire-bonding LED packages in order to understand its thermal dissipation mechanism. In experimental analyses, the junction temperature Tj and surface temperatures are measured by a junction temperature tester, thermal couples, and an infrared thermal imager, whereas the numerical analysis is carried out by an ANSYS simulation. After the validation of the simulation model with experimental results, the effects of FC bump number and underfill thermal conductivity on both Tj and thermal resistance Rth of the packages are investigated by this validated model. Furthermore, a simple model of effective thermal conductivity for a composite material of bumps and underfills is proposed for thermal analysis of the FCLED packages. Thermal results for the packages are presented and discussed in terms of volume fraction and thermal conductivity for bumps and underfills in this paper.
  • Keywords
    electronics packaging; flip-chip devices; infrared imaging; light emitting diodes; thermal conductivity; thermal resistance; ANSYS simulation; bump effects; flip-chip LED packages; flip-chip bump number; infrared thermal imager; junction temperature; surface temperatures; thermal behaviors; thermal conductivity; thermal couples; thermal dissipation; thermal resistance; underfill effects; underfill thermal conductivity; volume fraction; Electronic packaging thermal management; Gold; Junctions; Light emitting diodes; Substrates; Temperature measurement; Thermal conductivity; Flip chip (FC); junction temperature; light-emitting diode (LED); thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2013.2248365
  • Filename
    6471193