Title :
Theoretical limits of superjunction considering with charge imbalance margin
Author_Institution :
Toshiba Corp. Semicond. & Storage Products Co., Tokyo, Japan
Abstract :
This paper reports that the theoretical limit of the superjunction (SJ) structure is discussed with considering the charge imbalance margin. The SJ structure is attractive to reduce the specific on-resistance dramatically due to the charge compensation concept. The breakdown voltage, however, is lowered by the charge imbalance between n- and p-columns due to the electric field modulation. The analytical models of the theoretical on-resistance limit considered with the charge imbalance margin were provided in this work. The analytical results showed that the on-resistance reduction required not only lateral pitch narrowing but also the charge imbalance margin cut. This tendency can be confirmed from the experimental results in the previous works. The theoretical limit was estimated to be 7 mΩcm2 for 600 V-class SJ-MOS with the charge imbalance margin of 3%.
Keywords :
power MOSFET; semiconductor device breakdown; semiconductor doping; semiconductor junctions; SJ-MOS; breakdown voltage; charge compensation; charge imbalance margin; electric field modulation; on-resistance reduction; superjunction structure limit; superjunction theoretical limits; theoretical on-resistance limit; voltage 600 V; Analytical models; Doping profiles; Electric fields; Junctions; MOSFET; Modulation; analytical model; on-resistance limit; superjunction;
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4799-6259-4
DOI :
10.1109/ISPSD.2015.7123405