• DocumentCode
    712860
  • Title

    Fully-isolated NLDMOS behavior investigation during reverse recovery of parasitic diodes

  • Author

    Nan-Ying Yang ; Ming-Cheng Lin ; Haw-Yun Wu ; Wu, C.B. ; Chu, L. ; Lu, H.T. ; Lee, C.Y. ; Jong, Y.C. ; Tsai, J.L. ; Tuan, H.C. ; Kalnitsky, Alex

  • Author_Institution
    Analog / RF & Specialty Technol. Div. (R&D), Taiwan Semicond. Manuf. Co., Ltd., Hsinchu, Taiwan
  • fYear
    2015
  • fDate
    10-14 May 2015
  • Firstpage
    145
  • Lastpage
    148
  • Abstract
    The behavior of the fully-isolated laterally diffused MOSFETs (LDMOS) during reverse recovery of parasitic diodes such as buck converter or white light emitting diode (WLED) driver application was presented. The fully-isolated MOSFETs with parasitic diodes have been realized for high power application, but the related reverse recovery charge (Qrr) model fitting accuracy is still an issue for these devices. Generally, only a single model is used to cover all of the applications. However, Qrr behaviors are different between WLED driver and buck converter. In WLED output stage, two parasitic diodes within high-side switch MOS will be turned on. In buck converter application, there is only one parasitic diode within low-side switch MOS during dead time. We performed the measurement with decoupling Qrr extraction method to fit model under high-side and low-side operations. This resulted in significant Qrr model fitting accuracy improvement by 4 times.
  • Keywords
    light emitting diodes; power MOSFET; semiconductor device models; WLED driver; WLED output stage; buck converter; fully-isolated MOSFET; fully-isolated NLDMOS behavior; laterally diffused MOSFET; low-side switch MOS; model fitting accuracy; parasitic diode reverse recovery; reverse recovery charge model; white light emitting diode; Accuracy; Fitting; Light emitting diodes; MOSFET; Semiconductor device modeling; Semiconductor diodes; Switches; fully-isolated NLDMOS; reverse recovery charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on
  • Conference_Location
    Hong Kong
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4799-6259-4
  • Type

    conf

  • DOI
    10.1109/ISPSD.2015.7123410
  • Filename
    7123410