• DocumentCode
    712865
  • Title

    Series-connection of SiC normally-on JFETs

  • Author

    Xueqing Li ; Bhalla, Anup ; Alexandrov, Petre ; Hostetler, John ; Fursin, Leonid

  • Author_Institution
    United Silicon Carbide, Inc., Monmouth Junction, NJ, USA
  • fYear
    2015
  • fDate
    10-14 May 2015
  • Firstpage
    221
  • Lastpage
    224
  • Abstract
    The SiC normally-on JFET is a new member in the family of power devices. It is reliable and robust under high-temperature and high-voltage harsh operatioing conditions due to its pn-junction gate control and the excellent physical and electrical properties of Silicon Carbide. At present, 1200V SiC normally-on JFETs are commercially available and higher voltage JFETs are still under development. There is a strong need for a medium-voltage 4kV-15kV power switch that can be moved into mass production quickly, exploits all the material advantages of SiC technology, and is cost-effective. This work presents an innovative method to realize such a high voltage power switch by series-connecting low voltage SiC normally-on JFETs using a unique circuit topology. This work focuses on the discussions of the operation principle and the experimental demonstrations of the proposed technique.
  • Keywords
    junction gate field effect transistors; p-n junctions; power field effect transistors; power semiconductor switches; silicon compounds; wide band gap semiconductors; SiC; electrical property; high voltage power switch; medium-voltage power switch; normally-on JFET; physical property; pn-junction gate control; power devices; series-connection; silicon carbide; unique circuit topology; voltage 1200 V; voltage 4 kV to 15 kV; JFETs; Leakage currents; Logic gates; MOSFET; Silicon carbide; Switches; Temperature measurement; Cascode; JFETs; Normally-on; Series Connection; Silicon Carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2015 IEEE 27th International Symposium on
  • Conference_Location
    Hong Kong
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4799-6259-4
  • Type

    conf

  • DOI
    10.1109/ISPSD.2015.7123429
  • Filename
    7123429