Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation

Author

Yong Zhao ; Kerkhoff, Hans G.

Author_Institution

Testable Design & Test of Integrated Syst. (TDT) Group, Univ. of Twente, Enschede, Netherlands

fYear

2015

fDate

21-23 April 2015

Firstpage

1

Lastpage

5

Abstract

In this paper, functional I_DDQ testing has been applied for a 90nm VLIW processor to effectively detect aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test environment for validation, implementing an accelerated test (AT), has been investigated and I_DDQ measurement data resulting from AT is presented. It is found that the quiescent current for the processor characterizes power degradation with a coefficient of -0.025 with the aging trend. This is in coherence with behaviour of the NBTI aging mechanism, but contradicting other mechanisms such as TDDB. It shows the NBTI aging is the dominant factor for processor technology of 90nm and beyond.

Keywords

ageing; integrated circuit reliability; integrated circuit testing; life testing; microprocessor chips; multiprocessing systems; negative bias temperature instability; AT; NBTI aging mechanism behaviour; VLIW processor; accelerated test; aging degradation detection; functional quiescent current testing; health data; lifetime prediction; power degradation; processor technology; prognostic software; quiescent current; reliability evaluation; size 90 nm; Aging; Current measurement; Degradation; Reliability; Stress; Testing; VLIW; DSP processor; IDDQ testing; NBTI; aging; functional testing; nanoelectronics; reliability testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on

Conference_Location

Naples

Type

conf

DOI

10.1109/DTIS.2015.7127359

Filename

7127359