• DocumentCode
    713599
  • Title

    Automated characterization of TAS-MRAM test arrays

  • Author

    Grossi, Alessandro ; Zambelli, Cristian ; Olivo, Piero ; Pellati, Paolo ; Ramponi, Michele ; Alvarez-Herault, Jeremy ; Mackay, Ken

  • Author_Institution
    Dipt. di Ing., Univ. di Ferrara, Ferrara, Italy
  • fYear
    2015
  • fDate
    21-23 April 2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this work the characterization results of 1kbit TAS-MRAM arrays obtained through RIFLE Automated Test Equipment of 1Kbit array are reported. Such ATE, ensuring flexibility in terms of signals and timing, allowed evaluating hysteresis and to perform 50k write cycles in a very limited time, getting a first insight on TAS-MRAM arrays performance and reliability.
  • Keywords
    MRAM devices; automatic test equipment; reliability; RIFLE automated test equipment; TAS-MRAM test arrays; automated characterization; flexibility; hysteresis; reliability; signals; timing; Electrical resistance measurement; Magnetic hysteresis; Magnetic switching; Magnetic tunneling; Performance evaluation; Resistance; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on
  • Conference_Location
    Naples
  • Type

    conf

  • DOI
    10.1109/DTIS.2015.7127367
  • Filename
    7127367
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=713599