Title :
Automated characterization of TAS-MRAM test arrays
Author :
Grossi, Alessandro ; Zambelli, Cristian ; Olivo, Piero ; Pellati, Paolo ; Ramponi, Michele ; Alvarez-Herault, Jeremy ; Mackay, Ken
Author_Institution :
Dipt. di Ing., Univ. di Ferrara, Ferrara, Italy
Abstract :
In this work the characterization results of 1kbit TAS-MRAM arrays obtained through RIFLE Automated Test Equipment of 1Kbit array are reported. Such ATE, ensuring flexibility in terms of signals and timing, allowed evaluating hysteresis and to perform 50k write cycles in a very limited time, getting a first insight on TAS-MRAM arrays performance and reliability.
Keywords :
MRAM devices; automatic test equipment; reliability; RIFLE automated test equipment; TAS-MRAM test arrays; automated characterization; flexibility; hysteresis; reliability; signals; timing; Electrical resistance measurement; Magnetic hysteresis; Magnetic switching; Magnetic tunneling; Performance evaluation; Resistance; Switches;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on
Conference_Location :
Naples
DOI :
10.1109/DTIS.2015.7127367
